Research in Nanoelectronics
Fraunhofer Center Nanoelectronic Technologies (CNT) in Dresden works on the solution of various problems that the semiconductor industry is faced with. Its main fields of research are the characterization of materials, the development of analytic methods and the improvement of process technologies, based on a leading 300 mm tool set. Various synergy effects can be used due to the close cooperation with the business partner GLOBALFOUNDRIES and the existing know-how. Thus the innovations can be integrated quickly into the manufacturing process and the production costs and time can be reduced considerably.
News
Fraunhofer CNT and ASELTA Start Joint Collaboration
[Press release / 08-02-2012] Fraunhofer Center Nanoelectronic Technologies (CNT), Dresden and ASELTA Nanographics, Grenoble, today announced the joint development of e-beam proximity effect correction solutions for both mask writing and maskless lithography (ML2) applications. ASELTA Nanographics develops software solutions that reduce manufacturing writing time costs for chips at the 32nm node and beyond while improving pattern fidelity, including cycle time and lithography-image quality.
WoDiM 2012 - Call for Papers
The WoDiM 2012 - Workshop on Dielectrics in Microelectronics - is now calling for papers
(Deadline 27.02.2012)
Next Colloquium - 06.03.2012 / 3:00 - 4:00 pm
Dr. Wilfried Lerch, centrotherm thermal solutions GmbH & Co. KG
„Advanced Thermal Processes for Future CMOS Devices“
CNT Newsletter (December 2011)
Get the latest issue of the Fraunhofer CNT newsletter
Fraunhofer CNT Signs Joint Development Framework Agreement with Major Equipment Supplier
[Press Release / 7-12-2011] Fraunhofer CNT today announced the signing of a Joint Development Agreement with ASM International N.V. (ASM). The agreement provides a framework within which a variety of new projects will be executed over the course of the coming five years.
Fraunhofer CNT implements Critical Manufacturing's Software
Press Release / 6.12.2011] Fraunhofer CNT selects and implements Critical Manufacturing's Productivity Suite "cmNavigo" in Dresden.
Fraunhofer CNT at Semicon Japan (7.-9.12.2011)
The Fraunhofer CNT presents latest developments at Semicon Japan, togehter with the association Silicon Saxony.
2nd Fraunhofer Research Day - pictures now online
Fraunhofer CNT and Tokyo Electron announce to intensify its cooperation - 03.11.2011
Fraunhofer Center Nanoelectronic Technologies (CNT) and Tokyo Electron Limited (TEL) announce to intensify its cooperation. The institute acquired an automatic TEL wafer prober in order to meet the requirements of latest measuring tasks related to capacity, quality and positioning accuracy within a large temperature range.
2. Fraunhofer CNT Research Day - 02.11.2011
The 2. Fraunhofer CNT Research Day will take place on the 2nd November 2011. Experts from leading companies and scientific staff representatives of our institute present exciting talks to the audience.
Fraunhofer CNT Newsletter July 2011
Find more news about the Fraunhofer CNT in the current newsletter.
Fraunhofer CNT - the only research institution at the Semicon West
The Fraunhofer-Center Nanoelectronic Technologies (CNT) is the only research institution present at the trade fair’s Saxon joined booth. Prof. Dr. Peter Kücher, head of the Fraunhofer CNT, explains: "For us, it is the first booth representation at the SEMICON West...
Fraunhofer CNT at the Semicon West in San Francisco
From 12th - 14th July 2011 Fraunhofer CNT will present its newest developments on the Semicon West in San Francisco. The highlight of the exhibition is a self-powered sensor system which was designed by scientists of the competence area Devices & Integration. You will find us at the South Hall, booth number 2031.
Fraunhofer CNT - Organizer of the WoDiM 2012
The Workshop on Dielectrics in Microelectronics 2012 will be organized by Fraunhofer CNT. It will take place from 25 - 27 June 2012. Save the date now!
Fraunhofer CNT Annual Report 2010
The Fraunhofer CNT Annual Report 2010 now online available.
Dr. Ahmed Shariq - Invited Speaker on the NIST Physical Measurement Laboratory
Dr. Ahmed Shariq gives a lecture on "Atom Probe Tomography of Semiconducting Materials" in the "Microscopy for Nanoelectronics" session at 25th May in Grenoble, France.
Ultra low-k Processing at Fraunhofer CNT
Find more information in the product sheet.
Project week at Fraunhofer CNT
During a project week at Fraunhofer CNT two girls of the 8th class of the Martin-Andersen-Nexö-Gymnasium in Dresden created a model of Atomic Layer Deposition (ALD) which resulted in an educational video.
Fraunhofer CNT with lectures at the "Novel High K Application Workshop"
Dr. Jonas Sundqvist and Johannes Müller, scientists at Fraunhofer CNT, are invited to the "Novel High K Application Workshop" on 30.03.2011 to give a lecture. They are also involved with further contributions. Find the program and the registration at the namlab website.
50th Fraunhofer CNT Colloquium with Jan Sickmann, TU Dresden
We invite you to our 50th Fraunhofer CNT Colloquium on the 31st March, 2011 from 3.00 - 4.00 pm. Jan Sickmann talks about "Mapping nanofields in semiconductors by off-axis electron holography."
„ALD Lab Dresden“ – Research cooperation on ultra-thin films by Fraunhofer CNT and TU Dresden
The Fraunhofer Center Nanoelectronic Technologies (CNT) develops advanced process steps for manufacturing in nanoelectronic applications on 300 mm wafers. The Atomic Layer Deposition (ALD) is one of the key process technologies of the institute.
February 2011 - Fraunhofer CNT at the NANO TECH Japan 2011
From 16th - 18th February 2011 Fraunhofer CNT will present its newest developments on the NANO TECH in Tokyo, Japan. The highlight of the exhibition is a self-powered sensor system which was designed by scientists of the competence area Devices & Integration.
Press Release on the occasion of the "5. Nationaler IT-Gipfel"
Fraunhofer CNT Competence Areas
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